Instruments
State-of-the-art computational and experimental instruments are essential for advancing nanomaterial research, as they enable precise design, synthesis, and characterization at the atomic and molecular levels. Computational tools, such as molecular dynamics simulations and density functional theory, allow researchers to predict material properties, optimize structures, and explore new material combinations before physical synthesis. On the experimental side, cutting-edge techniques like scanning electron microscopy (SEM), atomic force microscopy (AFM), and X-ray diffraction (XRD) provide detailed insights into the morphology, structure, and properties of nanomaterials, validating theoretical predictions and guiding further development. The integration of these advanced tools accelerates innovation, enhances reproducibility, and ensures that researchers can push the boundaries of nanotechnology to develop materials with tailored properties for applications in energy, medicine, and environmental sustainability.
Computation
Ab initio computational chemistry provides a powerful tool for the detailed characterization of nanostructures, enabling the prediction of their electronic, structural, and chemical properties at the atomic level to guide experimental design.
Dynamic Light Scattering
Dynamic Light Scattering (DLS) is an effective technique for characterizing nanostructures by measuring their size distribution and hydrodynamic properties based on the scattering of light from nanoparticles in suspension under a wide range of experimental conditions.
SEM (Department)
Scanning Electron Microscopy (SEM) is a widely used technique for characterizing nanostructures, providing high-resolution images of their surface morphology and structural features at the nanoscale.
UV-VIS NIR
​UV-Vis NIR spectroscopy is a valuable technique for characterizing nanostructures, as it provides insights into their optical properties, such as absorption and bandgap behavior, across ultraviolet, visible, and near-infrared regions.
AFM-TERS
Atomic Force Microscopy coupled with Tip-Enhanced Raman Spectroscopy (AFM-TERS) enables high-resolution characterization of nanostructures by providing detailed topographical imaging and molecular-level chemical information simultaneously.
X-RD, SAXS (Department)
​X-ray Diffraction (XRD) and Small-Angle X-ray Scattering (SAXS) are powerful techniques for characterizing nanostructures, offering detailed information on their crystallographic properties, phase composition, and nanoscale size and shape distributions.
